Detection limit by electron probe microanalysis
نویسندگان
چکیده
منابع مشابه
Electron Probe Microanalysis (EPMA)
An electron microprobe is an electron microscope designed for the non-destructive x-ray microanalysis and imaging of solid materials. It is essentially a hybrid instrument combining the capabilities of both the scanning electron microscope (SEM) and an x-ray fluorescence spectrometer (XRF), with the added features of fine-spot focusing (~ 1 micrometer), optical microscope imaging, and precision...
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ژورنال
عنوان ژورنال: Journal of the Mineralogical Society of Japan
سال: 1976
ISSN: 1883-7018,0454-1146
DOI: 10.2465/gkk1952.12.special_35